Sanwood Technology Environmental Test Chamber | Enhancing Al Data Centers Reliability Verification

Al Data Centers are computing platforms specifically optimised for artificial intelligence workloads, undertaking critical tasks such as training large models. When operating at full capacity, the internal chips generate enormous heat. Cluster deployment environments are complex and variable, with multiple stresses interacting, posing severe challenges to reliability and energy efficiency. Sanwood Technology's Environmental Test Chambers simulates diverse cluster operating conditions, enabling comprehensive environmental stress screening of entire servers and thermal management systems. This provides critical assurance for the long-term reliable operation of computing infrastructure.

Product Description

Employing a modular design philosophy, Sanwood Technology's  Environmental Test Chambers offers multiple specifications ranging from 5m³ to 50m³, flexibly accommodating testing requirements from single servers to entire racks. The chamber features a high-strength stainless steel construction with double-layer insulation, complemented by a panoramic observation window and intelligent lighting system for visual monitoring throughout testing. A specially engineered load-bearing reinforced floor and intelligent power distribution system enable direct support and connection of high-power  Al Data Centers, simulating comprehensive environmental challenges under real-world operational conditions.

Technical Specifications

Temperature Range: -70°C to +150°C

Temperature Fluctuation: ≤1°C (unloaded, steady state)

Temperature Uniformity: ≤2.0°C (unloaded, steady state)

Heating Rate: 0°C to +50°C, ≥5°C/min (non-linear)

Cooling Rate: +50°C to 0°C, ≥5°C/min (non-linear)

Internal Dimensions: Customisable, accommodating full rack-scale testing

Testing Standards

Sanwood Technology Environmental Test Chambers strictly adhere to authoritative international and domestic standards to ensure test result reliability:

MIL-STD.202F High Temperature Life Test.

GJB150.3 High Temperature Test Method.

GJB150.4 Low Temperature Test Method.

IEC60068-2-1:2007 Low Temperature Test Method AB.

IEC60068-2-2:2007 High Temperature Test Method BA.

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Application Scenarios

Continuous operation of densely deployed servers generates significant heat. Environmental Test Chambers ensure optimal data centre management and performance.

Component Stress Testing: By subjecting servers, GPUs, and other critical components to extreme temperature and humidity conditions, potential failure points can be identified prior to deployment.

Thermal Design Validation: Our chambers validate thermal designs under diverse scenarios, ensuring that components withstand heat generated during intensive AI computations.

Accelerated Life Testing: Through environmental simulation, Environmental Test Chambers predict long-term reliability and uncover potential issues emerging over time.

Sanwood Technology is not only a supplier of testing equipment, but your partner on the journey towards product reliability. Beyond this, our portfolio includes Thermal Shock Test Chambers, Highly Accelerated Stress Test Chambers, and AGREE Chambers. Let us work together to contribute our solid efforts to building a robust and trustworthy AI computing infrastructure and empowering the intelligent transformation of thousands of industries.

For professional testing solutions, please contact Sanwood Technology, and we will tailor bespoke professional services to your specific needs.