Highly Accelerated Stress Test System (HAST Chamber)

Accelerate your reliability testing with our state-of-the-art Highly Accelerated Stress Test (HAST) Chamber. Engineered to simulate extreme temperature and humidity conditions, this system drastically reduces failure analysis time for semiconductors, IC packages, and electronic components. 

Fully compliant with JESD22-A102 standards, it is the essential tool for rigorous Environmental Stress Screening (ESS), HALT, and HASS protocols. Discover precise, repeatable results that help you enhance product durability and accelerate time-to-market.

• •Supports non-saturated and saturated steam modes to achieve high acceleration stress testing, significantly shortening traditional humidity-heat aging cycles.
• •Features a fully closed-loop temperature-humidity-pressure feedback system to ensure highly stable and repeatable test conditions.
• •The chamber employs high-strength stainless steel multi-layer welding construction, with standard mechanical safety valves, electronic overpressure protection, and bursting discs providing multiple layers of protection, meeting pressure vessel safety standards.
• •Supports HAST testing standards including JESD22-A110, JESD22-A118, and IPC-TM-650, with customizable testing solutions for optoelectronics, automotive-grade chips, and other applications.

The HAST High-Accelerated Stress Test Chamber primarily simulates extreme environments of high temperature, high humidity, and high pressure to rapidly evaluate the long-term reliability and moisture resistance of electronic products, particularly non-hermetically sealed devices:

• •Semiconductors and Integrated Circuits: Conduct accelerated temperature-humidity life testing and failure analysis for chips and packaged devices.
• •Automotive Electronics: Perform rigorous environmental reliability verification on automotive-grade chips, sensors, power modules, and other components.
• •Military and Aerospace: Evaluates long-term stability of high-reliability components and assemblies under extreme humid-heat conditions.
• •Communications and Optoelectronics: Screens communication products like optical modules and fiber devices for moisture resistance and long-term reliability.

SANWOOD Technology's HAST High-Accelerated Stress Test Chamber is primarily used for accelerated life testing of semiconductors, packaging, electronic components, and new materials under high-temperature, high-humidity, and high-pressure conditions. Its core application areas and corresponding standards are as follows:

• •MIL-STD-810: Semiconductors/Integrated Circuits: JESD22-A110 (JEDEC High Accelerated Temperature and Humidity Stress Test Standard).
• •Automotive Electronics: AEC-Q100 / AEC-Q101 (Reliability Requirements for Automotive-Grade Chips and Discrete Devices).
• •ISO16750: Military/Aerospace: MIL-STD-883 Method 1004 (High Reliability Testing of Microelectronic Devices)
• •ISO2233: Communications/Consumer Electronics: Telcordia GR-468 / JESD22-A118 (Optical Device and General Reliability Testing).

SAE J1211: Fundamental and General: IEC 60068-2-66 (International Electrotechnical Commission Constant Humidity and Heat Test Standard).