High and Low Temperature Chambers

SANWOOD Memory Burn-in Test System is specifically designed for reliability testing of semiconductor and electronic components. By precisely simulating extreme temperatures, it enables efficient batch aging screening of Burn-in Board. Featuring a highly uniform temperature field, rapid thermal response, and intelligent control, the equipment ensures consistent and repeatable test results, thereby enhancing the efficiency of product durability verification.

Sanwood Temperature test chambers serve as fundamental equipment for product reliability verification. By precisely simulating environmental conditions such as high temperatures, low temperatures, and temperature cycling, they evaluate the performance, durability, and adaptability of electronic components, industrial materials, and various products under extreme temperatures.

Sanwood The dual-chamber temperature test chamber features an innovative vertically stacked design, integrating two independently temperature-controlled test spaces within a single equipment frame to significantly reduce laboratory footprint. This unit supports simultaneous comparative testing under different temperature conditions or independent experiments, substantially enhancing R&D validation efficiency and equipment utilization flexibility.

Sanwood three-layer temperature test chamber employs an innovative vertical stacking structure, integrating three fully independent temperature-controlled test chambers within a single unit to achieve triple testing capacity within a limited footprint. This design supports simultaneous comparative testing under multiple temperature conditions or parallel testing of large sample batches, delivering a highly efficient and flexible thermal testing solution for R&D validation, quality control, and production inspection.