Website: Sanwood
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Electronics & Semiconductor

In the electronics and semiconductor industries, where component failure is not an option, environmental reliability testing is the critical gatekeeper of quality. Sanwood designs and manufactures precision test chambers that provide the exacting, repeatable conditions needed to validate the endurance and performance of integrated circuits (ICs), PCBs, sensors, and micro-electromechanical systems (MEMS) before they reach the market. From rigorous Qualification testing to high-volume Production Screening (HASS/HASA), our solutions accelerate the discovery of latent defects by simulating years of thermal fatigue, moisture ingress, and operational stress in a controlled laboratory environment. We engineer our chambers to comply with the industry's most stringent standards, including JEDEC (JESD22), MIL-STD-883, IEC 60068, AEC-Q100 for automotive chips, and IPC standards for assemblies.

Semi-conduct products are varied in sizes, testing conditions are also different. Sanwood prepared series of products, including different dimensions and different testing conditions, for semi-conduct products testing. Following are testing standards and regulations for semi-conduct products testing:

  • ISO 9001
  • JESD22
  • JESD47
  • MIL-STD-883
  • JESD94
  • ESD STM 5.1
  • JESD22
  • JEDEC JESD22-A114
  • AEC-Q100
  • JESD100
  • MIL-PRF-38534
  • IEC 61508
  • ISO 26262

Sanwood Climatic Test Chambers can test and evaluate quality, reliability, duration and performance of chipset, processor, sensors, transducer, storage driver, power source and other electric components, to ensure the products quality, reliability, duration and performance.

  • Chipset
  • Processor
  • Electric Components
  • IC
  • Circuit Board
  • Semi-conduct
  • Sensors
  • Transducer
  • Storage Drive
  • Power Source
  • Power Surge Protector
  • Touch Panel
  • Fuse
  • Capacitance
  • Resistance
  • Break/Connector

Test Conditions for semi-conducts are not only conventional temperature and humidity, but also some special conditions, such as salt spray, dust, altitude, vibration, ultra-low temperature, etc, because many semi-conduct products will work under such climatic conditions. Sanwood products will cover almost all those climatic conditions.

  • Temperature Test: Temperature can be from -70℃ to 180℃, for high temperature, low temperature, damp-heat alternating and damp-heat static test.
  • Humidity Test: Simulating humidity under different temperature conditions, long time +85℃/85%RH up to 1000 hours.
  • Salt Spray Test: Salt spray test is anti-corrosion test for products or materials, to test or evaluate anti-corrosion performance under different environmental conditions.
  • Dust Test: Dust test simulates conditions of outdoors or desert, to test or evaluate products sealing or protection stability and reliability.
  • Raining Test: Raining test simulate outdoor raining conditions, to test products water proof performance under different environmental conditions.
  • Altitude Test: Altitude test simulates low air pressure conditions, to test and evaluate products performance under low pressure conditions.
  • Vibration Test: Vibration test can simulate transportation conditions or products surrounding conditions while operation, to test products reliability and stability under such vibration or comprehensive conditions.
  • Stress: Stress can be working load of the products, or environmental condition stress while products long term operation. Stress test can evaluate or debug products defective factors, for engineers to improve it in future.

Electronics& Semiconductor Test Solutions

Altitude Test Chambers

Altitude Test Chambers

Sanwood Altitude Test Chamber simulates high altitude conditions with precise low pressure and temperature control for aerospace, automotive, and electronics testing. Engineered to meet MIL-STD, DO-160...

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Rapid-Rate Temperature Change Chambers (ESS)

Rapid-Rate Temperature Change Chambers (ESS)

Sanwood Rapid-Rate Temperature Change Chambers (ESS) is a fast temperature change test chamber for testing and evaluating performance and reliabilities for material and electronics. ESS test chamber of...

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Thermal Shock Test Chamber

Thermal Shock Test Chamber

The thermal shock test chamber is a device used to test the tolerance of materials, components, and electronic products to rapid temperature changes. It can simulate sudden temperature changes that pro...

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