Highly Accelerated Stress Test System (HAST Chamber)

Accelerate your reliability testing with SANWOOD state-of-the-art Highly Accelerated Stress Test (HAST) Chamber. Engineered to simulate extreme temperature and humidity conditions, this system drastically reduces failure analysis time for semiconductors, IC packages, and electronic components. Fully compliant with JESD22-A102 standards, it is the essential tool for rigorous Environmental Stress Screening (ESS), HALT, and HASS protocols. Discover precise, repeatable results that help you enhance product durability and accelerate time-to-market.