MIL-STD-202 Temperature Shock Test: Sanwood Technology Two-zone Thermal Shock Test Chamber

In the electronics and semiconductor field, reliability testing for chips, PCBs, and power devices is performed; MIL-STD-202 remains the foundational standard for military component certification. It is suitable for passive and electromechanical components such as resistors, capacitors, inductors, transformers, relays, connectors, and switches. Sanwood Technology independently developed Two-zone Thermal Shock Test Chamber strictly adheres to international testing standards, including MIL-STD-202 Method 107 (Thermal Shock), which assesses component reliability under rapid extreme temperature fluctuations. By rapidly switching between high and low temperatures, it simulates harsh environments and provides a comprehensive reliability verification solution for products.

Basic parameters of Sanwood Technology Two-zone Thermal Shock Test Chamber:

Shock temperature range: -55°C ~ +150°C

Temperature fluctuation: ±1°C

Low-temperature precooling time: +25°C ~ -70°C within 60mins, 1.0 ~ 3.0°C/min

High-temperature preheating time: +25°C ~ +200°C within 45mins, 3.0 ~ 7.0°C/min

Temperature conversion time: 10 s

Temperature recovery time: within 5mins/within 3mins

Sanwood Technology Two-zone Thermal Shock Test Chamber can be customized according to customer parameter requirements. It strictly adheres to international standards such as MIL-STD-202 to ensure the accuracy of test results.

Features of Sanwood Technology Two-zone Thermal Shock Test Chamber:

Dual-chamber design:

Fast temperature recovery, eliminating test errors caused by temperature transitions in single-chamber equipment.

Complete isolation between high and low temperature environments ensures temperature stability.

Fast temperature conversion:

Conversion time: Typically ≤10 seconds (from high to low temperature or vice versa), meeting stringent standards.

Temperature ramp rate: Some models can reach over 30°C/min.

Precise temperature control and uniformity:

Temperature control accuracy: ±0.5°C ~±2°C (depending on model).

Temperature uniformity: ±1°C ~ ±2.5°C (ensuring test consistency).

Data logging and monitoring:

Real-time display of temperature curves, cycle counts, and fault logs.

Data export: Supports USB/RS-485/Ethernet connections and is compatible with LabVIEW or specialized software.

From RF modules for 5G base stations to power semiconductors for new energy vehicles, electronic semiconductor products are evolving towards higher performance and more complex environments, placing increasing demands on reliability. Sanwood Technology, always prioritizing customer needs, is committed to providing professional and efficient environmental testing equipment to customers worldwide. Its MIL-STD-202-compliant Two-zone Thermal Shock Test Chamber has been successfully used by numerous renowned semiconductor companies both domestically and internationally, helping them improve product reliability. Sanwood Technology also offers a variety of testing equipment, including Constant Temperature Humidity Test Chambers, ESS Test Chambers, and AGREE Test Chambers, supporting customized services.

If you need to get professional testing solutions, please contact Sanwood Technology, we will customize professional services for you.